An Efficient Selective Trigger Scan Architecture for VLSI Testing

Abstract

Time, power, and data volume are among some of the most challenging issues for testing System-on-Chip (SoC) and have not been fully resolved, even if a scan-based technique is employed. A novel architecture, referred to the Selective Trigger Scan architecture, is introduced in this paper to address these issues. This architecture reduces switching activity in the circuit-under-test (CUT) and increases the clock frequency of the scanning process. An auxiliary chain is utilized in this architecture to avoid the large number of transitions to the CUT during the scan-in process, as well as enabling retention of the currently applied test vectors and applying only necessary changes to them. The auxiliary chain shifts in the difference between consecutive test vectors and only the required transitions (referred to as trigger data) are applied to the CUT. Power requirements are substantially reduced; moreover, DFT penalties are reduced because no additional multiplexer is utilized along the scan path.